IEEE Design & Test 
May-June 2003 
http://computer.org/dt/ 



Features 

Guest Editors' Introduction: On-Chip Power Distribution Networks 
Sani R. Nassif and Soha Hassoun 

Analysis and Optimization of Power Grids 
Sachin S. Sapatnekar and Haihua Su 

Impact of Low-Impedance Substrate on Power Supply Integrity 
Rajendran Panda, Savithri Sundareswaran, and David Blaauw 

Electrical Modeling of Integrated-Package Power and Ground Distributions 
Hui Zheng, Byron Krauter, and Lawrence Pileggi 

Clock and Power Gating with Timing Closure 
Arindam Mukherjee and Malgorzata Marek-Sadowska 

Microarchitectural dI/dt Control 
Ed Grochowski, David Ayers, and Vivek Tiwari 


Special Infrastructure IP Section 

Guest Editor's Introduction: Advances in Infrastructure IP 
Yervant Zorian 

Online Self-Repair of FIR Filters 
Alfredo Benso, Stefano Di Carlo, 
Giorgio Di Natale, and Paolo Prinetto 

Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield 
Yervant Zorian and Samvel Shoukourian 

Benefits of a SoC-Specific Test Methodology 
Md. Saffat Quasem, Zhigang Jiang, and Sandeep K. Gupta 

Infrastructure IP for Configuration and Test of Boards and Systems 
C.J. Clark and Mike Ricchetti 


DAC Watch 

DAC Highlights 
Luciano Lavagno and Limor Fix 

DAC Turns 40! 
Alberto Sangiovanni-Vincentelli 

DAC: Serving the EDA Community for 40 Years 
An Interview with Pat Pistilli 

DAC, Moore's Law Still Drive EDA 
An Interview with Ron Rohrer 

CASS Brings Publishing to Its DAC Partnership 
An Interview with Giovanni De Micheli 


Departments 

EIC Message 
Special Report: CADathlon 
DTAP Update 
The Road Ahead 
Standards 
Panel Summaries 
Conference Reports 
TTTC Newsletter 
DATC Newsletter 
The Last Byte 

Check out the July-August 2003 issue of D&T for a special issue on Advances in Physical IC Design: RTL to GDSII; plus an interview with Sir Robin Saxby, chair and founder of ARM Ltd. --------------------------------------------------- 
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